Articles In Academic Journals

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Year	Title
1988	Raman Scattering Characterization of the Microscopic Structure of Semi-Insulating Polycrystalline Si ( SIPOS ) Films.  J. Appl. Phys.. 2669.
1988	Strains in Silicon-on-Insulator Structures Formed by Oxygen Implantation: Raman Scattering Characterization.  Appl. Phys. Lett.. 483.