Articles In Academic Journals

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Year	Title
1995	Evaluation of Wafer Bonding and Etch Back for SOI Technology.  Philips Journal of Research. 91-124.

Conference Papers

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Year	Title
1993	Dependence of Breakdown Voltage on Drift Length and Buried Oxide Thickness in SOI RESURF LDMOS Transistors.  144-128.
1993	Measurement of Minority Carrier Diffusion Length and Lifetime in SOI Devices by Flying Spot Laser Scanner as a Function of Residual Misfit.  44.
1992	Light Scattering Topography Characterization of Bonded SOI Wafers.  375-385.
1992	SOI High Voltage LDMOS and LIGBT Transistors with a Buried Diode and Surface P-Layer
1992	Thermomechanical Device Processing Issues in Bonded SOI Wafers.  397-413.