Articles In Academic Journals

Filter

Year	Title
2014	Real time spectroscopic ellipsometry for analysis and control of thin film polycrystalline semiconductor deposition in photovoltaics.  Thin Solid Films. 442-446.
2014	Real-Time, In-Line, and Mapping Spectroscopic Ellipsometry for Applications in Cu(In1-xGax)Se2 Metrology.  IEEE Journal of Photovoltaics. 333-339.
2013	Correlations between mapping spectroscopic ellipsometry results and solar cell performance for evaluations of nonuniformity in thin-film silicon photovoltaics.  IEEE J. Photovolt.. 387-393.
2013	Large-area compositional mapping of Cu(In1?xGax)Se2 materials and devices with spectroscopic ellipsometry.  IEEE J. Photovolt.. 359-363.
2013	Optical Monitoring and Control of Three-Stage Coevaporated Cu(In1-xGax)Se2 by Real-Time Spectroscopic Ellipsometry.  IEEE J. Photovolt.. 375-80.